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EMC//
Troubleshooting Tools

OUR BRANDS // 

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Now you can SEE high frequency electromagnetic fields. There are high demands for electromagnetic compatibility (EMC) of electronic products. The demands are stated in different set of rules for example VCCI, ANSI,CISPR, FCC and VDE. These demands are specified for products or systems and not for components or elements. The fact that there is no easy way to find the exact location of a radiating source is a problem for designers today.

Detectus AB has developed a measuring system with which the designers can measure the intensity and the location of a radiation source at a component level. The results of such a measurement can be shown as two or three dimensional colored maps

Why Use an EMC Scanner

  • You save time and money by reducing your need for expensive and time consuming full scale measurement.

  • You can see the emission at components level.

  • Early in the design phase you can detect potential emission problems.

  • You can make comparative measurements to document the effect of a change in design. (Useful when there is a need to archive design changes.)

  • You can maintain a high quality in the production line by meas-uring samples and comparing them to a reference.

  • You do not have to know what frequencies you are looking for thanks to the Prescan function.

  • You can use your own instruments

  • You can easily document (ISO900x) the emission spectra of your products in both design and production phase

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Near Field Probes (E & H field), Preamplifiers, Development System Disturbance Emissions, Set HF-Transformer. Pre-compliance EMC test and measuring devices.  Measure Disturbance Immunity: Development System Disturbance Immunity, Magnetic Field Probes, MINI-Burst generators, Field Source Sets, Burst Transformer, Optical Signal Acquisition (1/2/4 channels), Optical Fibre Probe analog, Burst Detectors. Measurement Radiated Emissions

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P1 mini burst field generator set

The E and B mini burst field generator contained in the P1 set generate a local pulse field of extreme intensity and steepness at the probe tip. This pulse field corresponds to the field which develops under the influence of burst and ESD processes on electronic modules. Weak spots can be located and their type (E/B field) and sensitivity can be determined through the locally emitted E or B fields.

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